The single event effects such as SEU/SET will cause dysfunction to FPGA which work in space radiation environment. This paper focuses on the SEU effects of SRAM-based FPGA and mitigation techniques. A completed solution based on radiation-hardened FPGA and intelligent scrubbing chips produced by Beijing Microelectronics Technology Institute (BMTI) is constructed. To evaluate effectiveness of the solution, a verification test is designed and heavy ion irradiation test is carried out.