PLANNING RELIABILITY TESTING OF TECHNOLOGICAL SYSTEMS VIA PRODUCTIVITY CRITERION

This paper considers developing reliability estimate testing plans for technological systems. It is well recognized that the loss of technological system productivity is mainly caused by item fails or fluctuations of final product quality level. The relation between Pr and Pn is shown by technological system availability. A new statistical model for testing technological system duration, based on initial criterion for obtaining required availability, is developed. Secondly, a new testing plan is developed for the estimate availability of technological system, for the case of exponential distribution time of state of functioning and failure. The initial testing parameters which were considered included: error of availability estimate, confidence probability level, and distribution of time of state of functioning and failure. The testing duration is calculated by the number of failures in the course of testing of the technological system. In the case of exponential distribution of time of state of functioning and failure, the general testing plan for reliability estimate of technological system is obtained by varying the testing plan initial parameters’ values.

• Joseph Aronov
• Papich Ljubisa

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